Dr. Konstantin Kartaschew
Konstantin Kartaschew is an Advanced Workflow Specialist at Leica Microsystems
He holds a PhD in physical chemistry from the Ruhr University Bochum (Germany), with a focus on micro-spectroscopic analysis. After his PhD he broadened his experience, as a product specialist for spectroscopy within several molecular and elemental spectroscopy (e.g. atomic emission and X-ray fluorescence spectroscopy) methods. In 2019 he joined Leica Microsystems as a specialist in LIBS (Laser-induced Breakdown Spectroscopy) and further specific compound microscopy applications. Konstantin’s role give him the opportunity to exchange with customers in different industries. Learning about their challenges and offering them practical advice gives him great job satisfaction.
![[Translate to chinese:] Optical microscope image of salt contamination on an aluminum/silicon (Al/Si) surface. Credit: Gerweck GmbH, Germany. Electroplating_LIBS_on-dema.jpg](/fileadmin/_processed_/0/5/csm_Electroplating_LIBS_on-dema_763a86fa98.jpg "[Translate to chinese:] Optical microscope image of salt contamination on an aluminum/silicon (Al/Si) surface. Credit: Gerweck GmbH, Germany.")
![[Translate to chinese:] Optical microscope image, which is a composition of both brightfield and fluorescence illumination, showing organic contamination on a wafer surface. The inset images in the upper left corner show the brightfield image (above) and fluorescence image (below with dark background).](/fileadmin/_processed_/a/1/csm_Organic_contamination_on_a_wafer_surface_7072894d1c.jpg "[Translate to chinese:] Optical microscope image, which is a composition of both brightfield and fluorescence illumination, showing organic contamination on a wafer surface.")
![[Translate to chinese:] Image of burrs (red arrows) at the edge of a battery electrode acquired with a DVM6 digital microscope.](/fileadmin/_processed_/7/6/csm_Burrs_at_the_edge_of_a_battery_electrode_16a49a32a6.jpg "[Translate to chinese:] Image of burrs (red arrows) at the edge of a battery electrode acquired with a DVM6 digital microscope.")
![[Translate to chinese:] Particles observed on the surface of a particle trap which could be used for technical cleanliness during battery production.](/fileadmin/_processed_/4/9/csm_Particles_on_the_surface_of_a_particle_trap_d139be3a8e.jpg "[Translate to chinese:] Particles observed on the surface of a particle trap which could be used for technical cleanliness during battery production.")
